The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2004
Filed:
May. 28, 2002
Peter J. Ireland, Austin, TX (US);
Schlumberger Technology Corporation, Austin, TX (US);
Abstract
A method for obtaining quantitative characteristics of an area of investigation includes measuring characteristics of the area of investigation in a first dimension, coordinating the measured characteristics with an index of a second dimension, the coordinating enabling an identification of a trend of the measured characteristics, and extrapolating using the trend in the second dimension to obtain quantitative characteristics of the area of investigation. An apparatus configured for use in a drill hole environment includes a clock configured to receive data from the depth meter and a processor configured to correlate clock data and depth data to provide a time after bit measure associated with a plurality of measurements of the measurements taken by the tool whereby the measurements taken at different depths are useful as compared to measurements taken independent of the time after bit measurements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile