The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2004
Filed:
Apr. 21, 2000
Applicant:
Inventors:
Yuwu Zhang, Kawasaki, JP;
Masayoshi Uneme, Yamatokoriyama, JP;
Yasushi Fukaya, Niwa-gun, JP;
Kazuo Yamazaki, Sacramento, CA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/900 ;
U.S. Cl.
CPC ...
G06F 1/900 ;
Abstract
Operating information of a measuring device is extracted through analysis of at least a part program to execute measurement or output of measurements. Information facilitating maintenance and control of the measuring device is automatically generated from the operating information history.
Zhang, Yuwu. (2004). Maintenance-and-control apparatus and method for coordinate and surface texture measuring device (U.S. Patent No. 6708138). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6708138
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile