The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2004
Filed:
May. 06, 2002
Yasuo Yamazaki, Tokyo, JP;
Masaki Majima, Tokyo, JP;
Other;
Abstract
When product inspection results and an inspection frequency for each inspection item are input to the product inspection result input device , the inspection items are selected, the presence or absence of product inspection results required for each inspection item is determined, selection of previous product inspection results is performed via the inspection item master and inspection frequency master of the product standard management device , and product inspection results for other product batches measured previously are cited for insufficient data for each inspection item missing from the inspection results document according to the inspection item conditions of the inspection results document. Next, an overall pass-fail determination is performed by comparing the product inspection results and input from the product inspection result input device for each inspection item and product inspection results cited for products of other batches, with product standards and tolerances stored in the inspection item master for each inspection item for products for each customer.