The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2004

Filed:

Jan. 08, 2001
Applicant:
Inventors:

Joshua E. Rothenberg, San Jose, CA (US);

Hongpu Li, Fremont, CA (US);

Yao Li, Fremont, CA (US);

Jason Zweiback, Fremont, CA (US);

Jan Popelek, Fremont, CA (US);

Assignee:

Teraxion Inc., Quebec, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/34 ;
U.S. Cl.
CPC ...
G02B 6/34 ;
Abstract

Techniques for designing efficient gratings with multiple frequency response channels based on sampled patterns based predominantly on phase modulation of the underlying grating structure. Each period of the phase sampled patterns may include contiguous, discrete phase segments with different phase values, or alternatively, a continuous spatial phase pattern that changes the phase of the underlying grating structure. Moderate amplitude modulation of the underlying grating structure by the sampling structure may also be used together with phase modulation. The grating period or the sampling period may be chirped.


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