The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2004

Filed:

Apr. 03, 2002
Applicant:
Inventors:

Keith M. McClelland, Needham, MA (US);

Craig Dawson, Shirley, MA (US);

Ying Huang, Lexington, MA (US);

Andrea L. Whitson, Jamaica Plain, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/304 ;
U.S. Cl.
CPC ...
G01N 2/304 ;
Abstract

A system for remote inspection of items including at least one inspection machine constructed to examine an item under inspection to obtain information about the item, a database coupled to the at least one inspection machine that receives and stores the information about the item in an item file, the item including a unique item identifier, and an item file inspection device that receives the item file, analyzes data contained in the item file and records screening information based on an analysis of the item file. The system also includes a server that controls transfer of the item file and the screening information between the database and the item file inspection device. The screening information is linked with the item file using the unique item identifier. The item file inspection device is located remote from the at least one inspection machine.


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