The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2004
Filed:
Jan. 02, 2001
Robert S. Young, Jr., Austin, TX (US);
Richard D. Ball, Austin, TX (US);
Mark S. Bishop, Austin, TX (US);
Marc C. Digby, Austin, TX (US);
Christopher P. Hansen, Indianapolis, IN (US);
Clyde W. Hinkle, II, Austin, TX (US);
Philip E. Cannata, Austin, TX (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
One aspect of the present invention is a system for estimating sensor and illumination non-uniformities. The system comprises a first light source, and a first sensor operable to capture light reflected from a first side of film illuminated by the light source while the film has a developer chemical applied thereto and processing circuitry coupled to the first sensor. The processing circuitry is operable to capture a first plurality of readings from the sensor responsive to light reflected from an unexposed region of film to determine a first set of non-uniformity data and adjust image data obtained from the film in response to the first set of non-uniformity data. In a further embodiment, the processing circuitry is further operable to dim the first light source for at least a portion of the time that the sensor is being used to sense the unexposed region of the film. The processing circuitry may also capture a second plurality of readings from the sensor while the first light source is dimmed to determine a second set of non-uniformity data and adjust image data obtained from the film in response to the second set of non-uniformity data.