The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2004

Filed:

Oct. 04, 1999
Applicant:
Inventors:

Hideo Kusuzawa, Kobe, JP;

Yasuyuki Imura, Kobe, JP;

Hironori Kobayashi, Kobe, JP;

Masaki Ishisaka, Himeji, JP;

Assignee:

SYSMEX Corporation, Hyogo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/100 ;
U.S. Cl.
CPC ...
G01N 2/100 ;
Abstract

An optical information measuring apparatus includes: a light source section capable of emitting a plurality of light beams; a light guiding section for directing and supplying the plurality of light beams from the light source section to an object; an object lens arranged facing the object; a plurality of light receiving sections for respectively receiving the light beams from the object via the object lens; and a frame section for integrally mounting a plurality of optical elements including the light source section, the light guiding section, the object lens, and the light-receiving sections.


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