The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2004

Filed:

Sep. 27, 2001
Applicant:
Inventors:

George D Davis, Bellevue, WA (US);

Byron G Scott, Arlington, WA (US);

Assignee:

Honeywell International, Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01H 3/754 ; H01H 3/732 ;
U.S. Cl.
CPC ...
H01H 3/754 ; H01H 3/732 ;
Abstract

An integral resistance element combined with a snap-action thermal switch and coupled to an output thereof, the snap-action thermal switch being structured in a normally-open configuration. The resistance element and the snap-action thermal switch share one or more common terminals. The snap-action thermal switch is structured having a pair of terminals being mutually electrically isolated when the snap-action thermal switch structured in the normally open configuration, and the integral resistance element is electrically coupled to provide an output on the pair of electrically isolated terminals.


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Davis, George. (2004). Thermal switch containing preflight test feature and fault location detection (U.S. Patent No. 6707372). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6707372

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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