The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2004
Filed:
Apr. 15, 2002
Shridhar Champaknath Nath, Niskayuna, NY (US);
Thomas James Batzinger, Burnt Hills, NY (US);
Curtis Wayne Rose, Mechanicville, NY (US);
Yuri Alexeyevich Plotnikov, Clifton Park, NY (US);
Kenneth Gordon Herd, Niskayuna, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A method for in-situ eddy current inspection of at least one coated component includes applying a drive pulse at a measurement position on an outer surface of the coated component, while the coated component is installed in an operational environment of the coated component. The coated component includes a base metal and a coating disposed on the base metal. The method further includes receiving a response signal from the coated component, comparing the response signal with a reference signal to obtain a compared signal, analyzing the compared signal for crack detection, and determining whether a crack near the measurement position has penetrated into the base metal, if the presence of the crack in the coating is indicated.