The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2004

Filed:

Aug. 18, 2001
Applicant:
Inventor:

Mark Theodoor Looijer, Amsterdam, NL;

Assignee:

Shell Oil Company, Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/782 ; G01B 5/28 ;
U.S. Cl.
CPC ...
G01N 2/782 ; G01B 5/28 ;
Abstract

Method of detecting cracks in an object of an electrically conducting material that is covered by a non-conductive layer using a probe comprising a transmitter coil for inducing eddy currents in the object and a receiver coil comprising selecting a set of points of the object which are to be inspected; and which method further comprises for each point positioning the probe at the point, activating the transmitter coil to induce eddy currents in the object; creating a record of the signal provided by the receiver coil over a period of time; and examining the record and comparing it to reference records, wherein the presence or absence of a crack can be inferred from the comparison.


Find Patent Forward Citations

Looijer, Mark. (2004). Method for detecting cracks in electrically conducting material (U.S. Patent No. 6707296). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6707296

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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