The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2004

Filed:

Jun. 19, 2002
Applicant:
Inventor:

Ken-ichi Takano, Tokyo, JP;

Assignee:

TDK Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/312 ; G11B 5/39 ;
U.S. Cl.
CPC ...
G01R 3/312 ; G11B 5/39 ;
Abstract

A method and computer program to calculate a reproduction track width of a MR head. This method begins by subdividing the magnetic domain control layer of a MR element and lead conductors into several polyhedral elements. Thereafter, electric potentials are calculated for each of the polyhedral elements based on the resistance at each layer. A current density is determined for each of the polyhedral elements based on the calculated electric potentials. The current densities are integrated to calculate an initial resistance value. Further, the resistance of a local block is changed by a predetermined amount. The electric potential is calculated for each of the polyhedral elements, current density is acquired, and the acquired current densities is calculated to determine a resistance value. Finally, the reproduction track width is obtained based on the initial acquired resistance value and the acquired resistance value.


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