The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2004

Filed:

Apr. 24, 2003
Applicant:
Inventor:

Alain E. Perregaux, Rochester, NY (US);

Assignee:

Xerox Corporation, Stamford, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 4/014 ;
U.S. Cl.
CPC ...
H01J 4/014 ;
Abstract

In a photosensitive scanning apparatus, in which a plurality of chips are aligned to form a single linear array of photosensors, gaps of unknown width between photosensors on adjacent chips may have an effect on resulting image quality. A set of simple strategies can be used to overcome the problem. In a first strategy, for each chip, interpolation of output values of the photosensors is used to in effect displace the outputs of the photosensors by a predetermined amount toward a gap; within constraints, the predetermined displacement can be used without actual measurement of any gap width. In a second strategy, an interpolated output of a theoretical “phantom photosensor” disposed toward the gap is added to the output stream from each chip.


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