The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2004

Filed:

Jun. 13, 2001
Applicant:
Inventors:

Kehan Han, Montreal, Quebec, CA;

Kedu Han, Sugar Land, TX (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12M 3/06 ;
U.S. Cl.
CPC ...
C12M 3/06 ;
Abstract

The present invention provides an apparatus and methods to evaluate invasive potential of tumor cells. The apparatus permits culturing, staining and analysis of test samples to be performed on the same test plate to facilitate cell invasiveness tests. Methods for testing cell invasiveness in vitro are described.


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