The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2004
Filed:
Dec. 20, 2000
Applicant:
Inventors:
Tomotaka Yokoyama, Tokyo, JP;
Hiroshi Tomiyasu, Tokyo, JP;
Masatomo Shibui, Tokyo, JP;
Nobuyuki Eto, Tokyo, JP;
Assignee:
Hoya Corporation, , JP;
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/66 ;
U.S. Cl.
CPC ...
G11B 5/66 ;
Abstract
There are disclosed an information recording medium substrate having a surface roughness of Rmax 15 nm or less, and an information recording medium, particularly an information recording medium substrate and information recording medium in which for surfaces of the substrate and medium, a bearing area value (offset bearing area value) in a depth of 0.5 to 5 nm (predetermined slice level) from a bearing height (real peak height) corresponding to the bearing area value of 0.2% to 1.0% is 90% or less, and a manufacture method of the substrate and medium.