The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2004

Filed:

May. 02, 2002
Applicant:
Inventors:

Gregory David Shteinhauz, Akron, OH (US);

Yiu Wah Luk, Hudson, OH (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 1/702 ; B24B 4/900 ;
U.S. Cl.
CPC ...
G01M 1/702 ; B24B 4/900 ;
Abstract

Method to identify and remove machine contributions from tire uniformity measurements made on a tire uniformity machine by synchronizing and averaging together multiple measurements of tire uniformity made on a single test tire that is re-mounted between measurements in a randomly determined orientation relative to a rim reference mark on the rim of the tire uniformity machine. A cross-correlation function is calculated for each measurement relative to the first measurement, and an angular shift is determined from each cross-correlation function. The angular shifts are used to synchronize the measurements so that they can be averaged together. The resulting average test tire uniformity data has both machine contribution and random measurement noise minimized. An average machine contribution data set is determined by synchronizing and subtracting the average test tire uniformity data from each test tire uniformity measurement data set, then averaging together the resulting data sets. Corrected production tire uniformity data is obtained from a single measurement of production tire uniformity by subtracting the average machine contribution data from the production tire uniformity measurement data.


Find Patent Forward Citations

Loading…