The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 2004
Filed:
Feb. 18, 2000
Applicant:
Inventors:
Michael Ming Tak Leung, Sunnyvale, CA (US);
Leo Ki Chun Fu, San Jose, CA (US);
Borivoje Nikolic, Berkeley, CA (US);
James Kar Shing Chiu, Sunnyvale, CA (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M 1/300 ;
U.S. Cl.
CPC ...
H03M 1/300 ;
Abstract
A branch metric computation using limited bits by clipping the dynamic range and/or approximating the square of the difference between a sample value and the target value by a lookup table or piecewise linear with comparable slopes.