The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 2004
Filed:
Dec. 12, 2000
Applicant:
Inventor:
Gordon D. Ford, Round Rock, TX (US);
Assignee:
Eastman Kodak Company, Rochester, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 ;
U.S. Cl.
CPC ...
G06T 5/00 ;
Abstract
A system and method for correcting defects in images. A secondary defect map, defining heavily damaged portions of the image which were not corrected automatically, is generated. The secondary defect map allows the user to correct the defects by highlighting the uncorrected areas. Once the secondary defect map is generated, if the user selects the defect, it is filled in with a correction value obtained from surrounding “good” pixels only, rather than all the pixels—corrected and uncorrected—in a surrounding area.