The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 2004

Filed:

Aug. 04, 1999
Applicant:
Inventors:

Daisuke Inagaki, Osaka, JP;

Yasuhisa Ikushima, Osaka, JP;

Assignee:

Keyence Corporation, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

An inspection system in which an inspection of a work is conducted by processing image data of the work. The inspection system includes a data processor for storing image data of the work in a memory and executing data processing of the image data stored in the memory, a set process storing section for dividing a plurality of inspection items, which need different data processing respectively, of the image data stored in the memory into a plurality of groups within performance of the data processor and storing the plurality of inspection items, and an execution controller for causing the data processor to execute sequentially data processing of the image data stored in the memory in unit of group which is stored in the set process storing section.


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