The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 2004

Filed:

May. 04, 2001
Applicant:
Inventor:

Yutaka Tsuchiya, Hamamatsu, JP;

Assignee:

Hamamatsu Photonics K.K., Shizuoka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/100 ; A61B 5/00 ;
U.S. Cl.
CPC ...
G01N 2/100 ; A61B 5/00 ;
Abstract

Pulsed light of predetermined wavelengths or modulated light of predetermined frequencies from a light source is injected into a scattering medium as a measured object and output light therefrom is detected by a photodetector . Further, measuring methods and apparatus are configured so as to process and compute internal information by a signal processing unit and an computation processing unit , and the internal information of the scattering medium is obtained by calculating the difference between absorption coefficients by use of the time integrated spectroscopy (TIS method) and the phase modulation spectroscopy (PMS method) based on the MBL law in accordance with a spectroscopy method (MVS method) making use of a mean pathlength and a variance, or physical quantities equivalent thereto. This enables the internal information of the scattering medium to be measured accurately and quickly.


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