The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 2004

Filed:

Oct. 27, 2000
Applicant:
Inventors:

Stephen R. Falcon, Woodinville, WA (US);

Richard St. Clair Bailey, Bellevue, WA (US);

Dan Banay, Seattle, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/300 ;
U.S. Cl.
CPC ...
G06F 1/300 ;
Abstract

Improved methods and arrangements provide user interface platforms that are capable of meeting the unique requirements of manufacturers, while also advantageously supporting the development of independently designed software applications. In accordance with certain aspects of the present invention, methods and arrangements are provided whereby certain key events are defined and operatively associated with the hardware suite. These key events, which are essentially virtual events, can be invoked or otherwise implemented by the manufacturers and independent software vendor (ISV) applications. These key events are categorized as being either determinate events or indeterminate events, and their functionality can be based on different behavior models. The behavior models consider the notion that the user interface will most likely include various focusing (e.g., function selection) and/or editing (e.g., parameter modifying) capabilities. As such, the methods and arrangements can support several different behavior models, including, for example, a full-focus mode, a focus-free mode, and an edit-free mode.


Find Patent Forward Citations

Loading…