The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 2004

Filed:

Dec. 27, 2001
Applicant:
Inventors:

Shogo Fukushima, Moriguchi, JP;

Shuji Murakami, Takaishi, JP;

Kenshi Suzuki, Osaka, JP;

Ryoji Nakajima, Hirakata, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 1/300 ;
U.S. Cl.
CPC ...
A61B 1/300 ;
Abstract

An apparatus for examining a subject's brain functions acquires two or more indexes of pupillary indexes that show the subject's pupillary characteristics, visual indexes that show the subject's visual system functions, intelligence evaluating indexes that are results of the an intelligence test carried out on the subject, and behavior evaluating indexes that show the results the subject's behavior examination. Two or more indexes are stored in a memory and outputted from an output unit. By combining two or more kinds of independent indexes, accurate determination of dementia cases and further the degree of senescence of brain functions can be achieved. In addition, the brain function examining apparatus puts together a number of a plurality of indexes by the multivariate calculation and converts the indexes into different values of fewer numbers.


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