The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2004
Filed:
Mar. 31, 1998
Stephen Schroeder, Stoughton, MA (US);
Keith M. Conger, Foxborough, MA (US);
Richard Wade, Mansfield, MA (US);
Michael Jaimie Cooper, Marietta, GA (US);
Motorola, Inc., Schaumburg, IL (US);
Abstract
In a system, device, and method for selecting a channel from among a plurality of channels, a number of available channels are selected for testing. A channel quality measurement is made for each of the number of available channels. The channel having the best channel quality measurement is then selected. To make the channel quality measurements, a primary station selects a channel to be tested and also selects a secondary station with which to perform the test. The primary station transmits a control frame to the selected secondary station, including a channel identifier identifying the selected channel. Upon receiving the control frame, the selected secondary station adjusts its transmitter to the selected channel based on the channel identifier in the control frame, and transmits a reference signal on the selected channel. Meanwhile, the primary station adjusts its receiver to the selected channel and receives the reference signal from the selected secondary station. The primary station then measures the quality of the received reference signal.