The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 2004

Filed:

Apr. 24, 2002
Applicant:
Inventors:

Alain Blouin, Montreal, CA;

Denis Drolet, Montreal, CA;

Jean-Pierre Monchalin, Montreal, CA;

Christian Padioleau, Montreal, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 ;
U.S. Cl.
CPC ...
G01B 9/02 ;
Abstract

In order to probe an object in motion subject to surface displacement, for example, caused by ultrasonic wave propagation, a laser beam is split into a first portion and a second portion. The first is scatted off the object to generate a signal beam. The frequency shift produced in the signal beam due to motion of the object is measured, and this is used to adjust the frequency of one or both portions of the laser beam so that both beams have substantially the same frequency. The surface displacements are measured by comparing the second portion of the laser beam and the signal beam after frequency adjustment.


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