The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 2004

Filed:

Oct. 17, 2002
Applicant:
Inventors:

Thomas M. Baer, Mountain View, CA (US);

Mark A. Enright, Cupertino, CA (US);

David F. Head, Los Gatos, CA (US);

Christopher E. Todd, San Jose, CA (US);

Assignee:

Arcturus Engineering, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/00 ;
U.S. Cl.
CPC ...
G01N 1/00 ;
Abstract

Systems and methods for laser capture microdissection are disclosed. An inverted microscope includes an illumination/laser beam delivery system that is adapted to both illuminate a sample and provide energy for laser capture microdissection of the sample. The systems and methods provide the advantages of increased speed and much lower rates of contamination.


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