The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 2004

Filed:

Jul. 17, 2002
Applicant:
Inventors:

Ramzi Abou-Jaoude, Santa Clara, CA (US);

Donald Bradley, Morgan Hill, CA (US);

Karam Noujeim, Sunnyvale, CA (US);

David Geller, San Jose, CA (US);

Martin I. Grace, San Jose, CA (US);

Assignee:

Anritsu Company, Morgan Hill, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01S 7/40 ;
U.S. Cl.
CPC ...
H01S 7/40 ;
Abstract

An automotive radar test system includes circuitry for multiple down and up conversions of a signal from the automotive radar. Conditioning circuitry delays an intermediate frequency signal (IF ) obtained after a second down conversion to simulate the delay of a return signal from an object located a particular distance from the automotive radar, and to attenuate the IF signal to simulate variable target sizes, and to generate a Doppler shift in the IF signal to simulate target speed. The conditioned signal is up-converted and transmitted back to the automotive radar system to determine if the automotive radar provides accurate readings for distance, size and speed. The radar test system further couples the second IF signal to a spectrum analyzer to determine if the automotive radar is operating in the desired bandwidth and to a power meter to determine if the automotive radar is transmitting at a desired power level.


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