The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2004
Filed:
Mar. 29, 2000
Dee H. Wu, Shaker Heights, OH (US);
Wayne R. Dannels, Richmond Heights, OH (US);
Koninklijke Philips Electronics, N.V., Eindhoven, NL;
Abstract
A method of magnetic resonance imaging is provided. It includes supporting a subject in an examination region of an MRI scanner (A), and applying an EPI pulse sequence with the MRI scanner (A) to induce a detectable magnetic resonance signal from a selected region of the subject. The magnetic resonance signal are received and demodulated to generate raw data. Applied to the raw data are a pair of ghost reducing correction factors (&thgr;,&Dgr;). The pair of corrections factors (&thgr;,&Dgr;) included a phase correction (&thgr;) and a read delay (&Dgr;). The phase correction (&thgr;) compensates for phase errors in the raw data, and the read delay (&Dgr;) effectively shifts a data acquisition window ( ) under which the raw data was collected to thereby align the raw data in k-space. The correction factors affect how data is loaded into k-space to generate k-space data, and the k-space data is subjected to a reconstruction algorithm to generate image data. Thereafter, values for the pair of correction factors (&thgr;,&Dgr;) are derived from the image data.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile