The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 2004

Filed:

May. 02, 2001
Applicant:
Inventors:

H. Keith Nishihara, Los Altos, CA (US);

Brian P. Wilfley, Los Altos, CA (US);

Assignee:

Alara, Inc., Hayward, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/304 ; G03B 4/208 ;
U.S. Cl.
CPC ...
G01N 2/304 ; G03B 4/208 ;
Abstract

A method of compensating for differences in detective gain between a plurality of different scanning heads in a multiple scanning head imaging plate scanner, comprising: (a) scanning each of the scanning heads across an imaging plate thereby determining the detected signal at successive locations across the imaging plate for each of the scanning heads; (b) calculating an inverse relationship to the detected signal at successive locations across the imaging plate for each of the scanning heads; (c) scanning each of the scanning heads across an imaging plate containing an image thereon, thereby determining an image value at the successive locations across the imaging plate for each of the scanning heads; and (d) applying the inverse relationship to the determined image values at the successive locations across the imaging plate for each of the scanning heads.


Find Patent Forward Citations

Loading…