The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6698861 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 02, 2004

Filed:

Jun. 16, 2003
Applicant:
Inventor:

Donald J. Drake, Rochester, NY (US);

Assignee:

Xerox Corporation, Stamford, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/205 ; B41J 2/145 ; B41J 2/15 ;
U.S. Cl.
CPC ...
B41J 2/205 ; B41J 2/145 ; B41J 2/15 ;
Abstract

In a technique for obscuring the stitch error perceived the eye of a viewer, a first plurality of drops of fluid are ejected in a first firing sequence at a medium in a first swath from a print head including at least one die having a plurality of nozzles while moving in a first direction relative to the medium. Thereafter, the medium is advanced in a second direction substantially perpendicular to the first direction. The print head is again moved in the first direction and a second plurality of drops of the fluid are fired at the medium in a second swath adjacent the first swath. A controller randomly modulates the spot size resulting from the drops of the fluid. The stitch error may be a misplacement of the second swath relative to the first swath and the second plurality of drops includes a random variety of drop sizes.


Find Patent Forward Citations

Drake, Donald. (2004). Spot size noise to minimize stitch error perception (U.S. Patent No. 6698861). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6698861

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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