The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2004
Filed:
Nov. 07, 2002
Hideki Chujo, Mukou, JP;
Tomohiro Inoue, Kusatsu, JP;
Omron Corporation, Kyoto, JP;
Abstract
An unintentionally overlapped condition in a paper sheet being transported is detected by making ultrasonic waves incident on its path and detecting a phase difference between the received ultrasonic waves and a predetermined standard phase. For detecting an overlap on the basis of this phase difference, a specified data item on the detected overlap such as a cumulative number of times an overlap has been detected is generated and one of a plurality of preliminarily defined levels corresponding to this specified data item is selected. The selected level is outputted. If the overlap is detected over an entire detection range of the paper sheet from its front edge to the back edge, however, it is concluded that there is no possibility of an unintentional overlap.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile