The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2004
Filed:
Mar. 07, 2003
Noboru Yamamoto, Tsuchiura, JP;
Ken Takeuchi, Ibaraki, JP;
Naoya Kawakami, Tsuchiura, JP;
Toshiyuki Hebaru, Tsuchiura, JP;
Makoto Ishijima, Ibaraki, JP;
Tohru Miyata, Tsuchiura, JP;
Hitachi Kenki FineTech. Co., Ltd., Tokyo, JP;
Abstract
An ultrasonic inspection apparatus obtains information on the interface of a sample as digital waveform data for any “unit measurement range” and is provided with at least two data memories and controlled by a scan state monitoring signal showing the scan state of a unit measurement range belonging to a first group or a unit measurement range belonging to a second group. A comparator-register/memory-control-circuit outputs the scan state monitoring signal to the two data memories. The operating states of the two data memories being controlled by the scan state monitoring signal to alternate between writing of digital waveform data and readout of digital waveform data.