The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2004
Filed:
Dec. 06, 2001
Shahram Shirzad, Castskill, NY (US);
John Ruediger Mader Viertl, Niskayuna, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method and system for nondestructively detecting and characterizing defects in articles, including assemblies that may include components formed of composite materials. The method entails vibrating an entire article/assembly to induce an oscillating strain in the article/assembly so that any flaws in the article/assembly are heated by localized friction, as would occur between opposing surface portions of a defect or an interface between components of the assembly. The article/assembly is then infrared imaged to detect any localized temperature rises associated with the localized friction at the defect or interface.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile