The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2004
Filed:
Jun. 19, 2000
Naoki Satoh, Odawara, JP;
Yasuyuki Ito, Chigasaki, JP;
Akihiko Hirano, Odawara, JP;
Terumi Takashi, Chigasaki, JP;
Mikio Suzuki, Odawara, JP;
Other;
Abstract
Data byte errors are detected by a comparator and classified into errors for respective interleaves, and the classified errors are counted by counters in an error count block. Further, at the time one sector has been read, comparators compare the counted values for the respective interleaves with an interleave threshold to detect whether nor not there are interleaves which have a number of errors exceeding the interleave threshold, and the detected results are counted by an error count block. The frequency of retries after an ECC is predicted from the counted value on the error count block and the total number of read sectors.