The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2004
Filed:
Mar. 11, 2002
Keith R. Jones, Ramona, CA (US);
Gilberto Isaac Sada Treviño, San Diego, CA (US);
William W. Jones, San Diego, CA (US);
Ragnar H. Jonsson, Raykjavik, IS;
Mindspeed Technologies, Newport Beach, CA (US);
Abstract
A method and system for performing sequence time domain reflectometry to determine the location of line anomalies in a communication channel is disclosed. In one embodiment, the system generates a sequence signal and transmits the sequence signal over a channel. The system receives one or more reflection signals, and performs reflection signal processing on the reflection. In one embodiment, the reflection signal is correlated with the original sequence signal to generate a correlated signal. The system determines a time value between the start of the reflection signal and the subsequent points of correlation to determine a location of a line anomaly. In one embodiment preprocessing and post-processing occurs to counter the effects of a communication device, such as a DMT modulator/demodulator. In one embodiment sampling of the sequence and reflection signal may occur at different times or at a different phase to provide greater resolution of the line anomaly location.