The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2004

Filed:

Sep. 21, 2001
Applicant:
Inventors:

Jean-Pierre Blondel, Buc, FR;

Eric Brandon, Bourg la Reine, FR;

Patrice Le Roux, Villebon sur Yvette, FR;

Denis Toullier, Fleury les Aubrais, FR;

Assignee:

Alcatel, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G20B 6/42 ;
U.S. Cl.
CPC ...
G20B 6/42 ;
Abstract

The invention concerns a method for monitoring an optical waveguide between a monitoring terminal point and a monitoring unit, in which an optical data signal from a transmitter, and for amplification, pump light from a pump laser, is emitted into the optical waveguide, wherein a monitoring signal transmitted by the monitoring unit is returned via the same waveguide to the monitoring unit by a reflection device located at the monitoring terminal point, in particular a Bragg grating placed in the optical waveguide, and wherein the reflection device is tuned to a reflection that is exactly the wavelength of the monitoring signal, as well as a monitoring system and a monitoring unit for said Method.


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