The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2004

Filed:

Nov. 01, 1999
Applicant:
Inventor:

Patrick Alexandre, Gray, FR;

Assignee:

Sollac, Puteaux, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

A method for inspecting a surface of a moving strip to detect surface defects, which includes forming at least one digital picture of at least one face of the strip, in which the digital picture is made up of a set of successive rows of picture elements, each of which is assigned a digital value. The method also includes filtering the at least one digital picture to detect surface irregularities by detecting relative variations in the digital values, and processing the at least one filtered digital picture to identity a type of surface defect corresponding to each detected irregularity. Further, prior to the processing step, an overall characterization of each of the irregularities is performed by determining, a value of predetermined parameters characteristic of surface defects, and a prior classification of the irregularities is performed based on the determined values of the parameters, according to a set of predefined classes. The processing step is performed on each class, and the predetermined parameters characteristic of the surface irregularities is less than a total number of parameters used to identify the defect.


Find Patent Forward Citations

Alexandre, Patrick. (2004). Method for inspecting the surface of a moving strip by prior classification of the detected surface irregularity (U.S. Patent No. 6697516). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6697516

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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