The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2004
Filed:
Sep. 27, 2002
Danny S. Moshe, Kiryat Ono, IL;
Green Vision Systems Ltd., Tel Aviv, IL;
Abstract
Method for generating intra-particle crystallographic parameter maps and histograms of a chemically pure crystalline particulate substance. Spectral imaging, in general, and focus-fusion multi-layer spectral imaging, in particular, combined with pattern recognition classification analysis are performed on individual particles for forming sets of single-particle spectral fingerprint data, characterized by single-particle spectral fingerprint spectra. Spectral shifts are identified in the single-particle spectral fingerprint data, for forming intra-particle crystallographic region groups each featuring sub-sets of intra-particle spectral fingerprint pattern data, where selected data elements in each sub-set are shifted relative to corresponding data elements in remaining sub-sets in the same intra-particle crystallographic region group. Each intra-particle crystallographic region group is associated with different crystallographic parameters of crystal type and crystal class, for forming intra-particle crystallographic parameter data, which is used for generating intra-particle crystallographic parameter maps and histograms of the chemically pure crystalline particulate substance throughout an entire multi-particle sample.