The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2004
Filed:
Jun. 13, 2002
Applicant:
Inventors:
Seiji Funakawa, Tokyo, JP;
Nobuaki Ema, Tokyo, JP;
Assignee:
Ando Electric Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01S 3/10 ;
U.S. Cl.
CPC ...
H01S 3/10 ;
Abstract
In a tunable laser source device for branching a light output from a tunable laser source portion to supply to a wavelength measuring device and a wavelength calibrating reference device and then controlling the tunable laser source portion in response to an output of the wavelength measuring device, at least one peak and one notch or two peaks or two notches or more in a measurement interference period of the wavelength measuring device are included between a plurality of reference wavelengths of the wavelength calibrating reference device.