The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2004
Filed:
May. 24, 2000
Nelson Cheng, Fremont, CA (US);
Bill Higgins, Palo Alto, CA (US);
Hai Nguy, San Jose, CA (US);
Steven Stupp, Mountain View, CA (US);
Steven Lambert, San Jose, CA (US);
Maxtor Corporation, Milpitas, CA (US);
Abstract
A method and apparatus for determining a lifetime for a medium to fail due to thermal decay of a magnetization pattern is provided. Different stress magnetic fields are applied to a write head for writing to a machine-readable medium resulting in a magnetic field on the medium. A time to failure, corresponding to each of the different stress magnetic fields, is determined, the time to failure being an amount of time for an amplitude of a signal on the medium to degrade beyond a predetermined failure criteria. A time to failure without a stress magnetic field is determined based on the corresponding times to failure determined for each of the different stress currents.