The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2004
Filed:
Jan. 10, 2002
Susanne Klein, Bristol, GB;
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
The present invention relates to the measurement of birefringence, particularly the optical characterization of retardation and eigenpolarization of an unknown retarding device ( ). An optical probe beam ( ) with a pre-determined polarization ( ) is split into two components ( ), with constant dynamic phase difference. The beam components ( ) pass through the retarding device ( ) in opposite directions so that the polarization of each probe beam component ( ) is retarded by an equal degree. Then, the retarded probe beam components ( ) together pass through a polarizing analyzer ( ) with a pre-determined polarization axis to resolve the polarization of each retarded probe beam component ( ) along said axis. The polarization resolved beams ( ) combine on an optical detector ( ) so that the beams maintain the same dynamic phase and interfere coherently depending on the geometric phase between the two beams ( ). The analyzer ( ) is rotated to resolve the polarization of each of the polarization resolved beams ( ) along its rotating axis, in order to vary the geometric phase and hence the measured interference from the detector ( ). The measured varying interference is used to calculate the retardation and eigenpolarization of the retarding device ( ).