The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2004
Filed:
Apr. 05, 2000
John Karp, Gray, ME (US);
Other;
Abstract
A polarized material inspection device that includes a light source, a first polarizing filter disposed within the optical path of the light source, a frame into which a second polarizing filter is disposed, and a support for positioning the frame such that an object may be viewed through the second polarizing filter. In the preferred embodiment, the first polarizing filter is rotatable through a ninety degree arc such that planes of polarization may be adjusted to be parallel or orthogonal to one another. The preferred embodiment also includes a light illumination assembly having a rotatably mounted linear polarizer at the polarizing output end. This light assembly is attached to a portion of the frame and may be adjusted such that the beam of light is directed to the desired portion of the surface. Within the frame is mounted a fixed linear polarizing filter of sufficient size to allow the entire illuminated surface to be viewed. The frame is mounted to an adjustable support arm that is attached to a tripod or other support to allow the apparatus to be fixed during a given procedure.