The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2004
Filed:
Dec. 30, 1998
Applicant:
Inventors:
Zhiliang Julian Chen, Plano, TX (US);
Eugene G. Dierschke, Dallas, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/217 ;
U.S. Cl.
CPC ...
H04N 5/217 ;
Abstract
A MOS architecture for reading rows of pixels in an area array imager. After initial setup, individual pixels are read one row at a time using one clock pulse per pixel.
Chen, Zhiliang. (2004). Fast frame readout architecture for array sensors with integrated correlated double sampling system (U.S. Patent No. 6697108). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6697108
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