The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2004

Filed:

Jul. 23, 2002
Applicant:
Inventor:

Neil E. Wood, Centreville, VA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K 3/356 ;
U.S. Cl.
CPC ...
H03K 3/356 ;
Abstract

A single-event upset immune flip-flop circuit is disclosed. The single-event upset immune flip-flop circuit includes a first single-event upset immune latch and a second single-event upset immune latch. The first single-event upset immune latch has two inputs and two outputs. The second single-event upset immune latch also has two inputs and two outputs. The two inputs of the second single-event upset immune latch is connected to the two outputs of the first single-event upset immune latch. The state of the first single-event upset immune latch changes only when the signal polarities at both inputs of the first single-event upset immune latch are identical. Similarly, the state of the second single-event upset immune latch changes only when the signal polarities at both inputs of the second single-event upset immune latch are identical.


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