The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2004
Filed:
Aug. 31, 2001
Yee Chin Wong, Tucson, AZ (US);
Andrea J. Yool, Tucson, AZ (US);
Kristi A. Hansen, Tucson, AZ (US);
Junius E. Taylor, Phoenix, AZ (US);
Engineering & Research Associates, Inc., Tucson, AZ (US);
Abstract
Apparatus for ablating organic material, such as tissue, during an EP procedure generates a monitor signal to provide unambiguous indicia of real time characteristics of the ablation site prior to, during and subsequent to the EP procedure by providing indicia representative of the impedance of the tissue along with indicia of the resistive and reactive components of the impedance. Inorganic materials, such as plastic, can be analyzed, welded or otherwise acted upon and the monitor signal will provide indicia representative of the real time characteristics of the material and change of character thereof. Application of the monitor signal alone can be used to determine the real time characteristics of either organic or inorganic materials to distinguish between healthy and abnormal or diseased tissue and to distinguish between similar inorganic materials having been subjected to different environments or conditions.