The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2004

Filed:

Dec. 28, 2001
Applicant:
Inventors:

Richard J. Radtke, Pearland, TX (US);

Robert A. Adolph, Houston, TX (US);

Hélène C. Climent, Sugar Land, TX (US);

Luca Ortenzi, Stafford, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 5/04 ;
U.S. Cl.
CPC ...
G01V 5/04 ;
Abstract

A method for tool path identification in formation evaluation includes obtaining measurements of formation properties in azimuthal sectors for each of a plurality of depth levels; calculating quality factors from the measurements; identifying a centroid or maximum of the quality factors among the measurements in each of the azimuthal sectors for each depth level; and associating the centroid or maximum of the quality factors at each depth level along a borehole to form the tool path. Calculating the quality factors may include parameterizing the measurements according to at least one factor selected from a spine factor, a rib factor, and a volumetric photoelectric factor. A method for determining corrected measurements for formation properties includes identifying a tool path from measurements taken in azimuthal sectors at each depth level along a borehole; and calculating a corrected measurement at the each depth level by averaging measurements in the azimuthal sectors adjacent the tool path.


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