The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2004
Filed:
Feb. 01, 2000
Applicant:
Inventors:
Kurt J. Halverson, Lake Elmo, MN (US);
Ai-Ping Wei, Woodbury, MN (US);
Jean Qiu, Woodbury, MN (US);
Clyde D. Calhoun, Stillwater, MN (US);
James G. Berg, Lino Lakes, MN (US);
James G. Bentsen, North St. Paul, MN (US);
Raymond P. Johnston, Lake Elmo, MN (US);
Assignee:
3M Innovative Properties Company, St. Paul, MN (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12M 1/34 ;
U.S. Cl.
CPC ...
C12M 1/34 ;
Abstract
A method for detecting a microorganism in a test sample is described. The method involves distributing microvolumes of a sample to a plurality of microcompartments of a culture device, incubating for a time sufficient to permit at least one cell division cycle of the microorganism, then detecting the presence or absence of the microorganism in the microcompartments. Also disclosed are devices for carrying out these methods.