The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2004

Filed:

Dec. 04, 2001
Applicant:
Inventors:

Devendra Vidhani, Sunnyvale, CA (US);

Tyler Thorp, Sunnyvale, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract

A technique for verifying decoupling capacitance using a maximum flow determination is provided. The technique involves generating a network representing decoupling capacitors and driver elements on an integrated circuit, selectively establishing connections between decoupling capacitors and driver elements, and determining a maximum flow of the network. Using the maximum flow of the network, a designer may then verify whether particular driver elements are receiving sufficient decoupling capacitance and whether particular decoupling capacitors are being used efficiently, and subsequently redesign an integrated circuit as deemed necessary.


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