The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2004
Filed:
May. 29, 2002
Salvatore Alfano, Monument, CO (US);
F. Kenneth Chan, South Riding, VA (US);
Meredith Lynn Greer, Louisville, KY (US);
The Aerospace Corporation, El Segundo, CA (US);
Abstract
A computationally efficient analytical method determines when two quadric surfaces, such as ellipsoids surfaces, share the same volume by adding an extra dimension to the solution space for providing extradimensional product matrices defining degenerate quadric surfaces. The method then examines computed eigenvalues associated the product matrices to determine when the two quadric surfaces share the same volume or when surface projected areas based on viewing angle share the same area. The method provides direct share volume results based on comparisons of the eigenvalues that can be rapidly computed. The method can be use for collision avoidance detection where the objects are modeled by quadric surfaces.