The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2004
Filed:
Apr. 04, 2002
Jyh-Ting Lai, Hsinchu, TW;
Faraday Technology Corporation, Hsinchu, TW;
Abstract
A method for overflow testing of a blind equalizer. The method uses the following steps; providing a primary located signal in a primary signaling point of a period by a signal generating loop; multiplying the primary located signal by a set of continuously decreasing signals to get a primary signal; providing a interfering located signal in a plurality of interfering signaling points of the period by a ISI generating loop, wherein the interfering signaling points are different from the primary signaling point; multiplying the interfering located signal by a set of continuously increasing/decreasing signals to get an interference signal; adding the primary signal and the interference signal to get the input signal; inputting the input signal to the blind equalizer to adapt the input signal, wherein the tap weights corresponding to the interference signal in a blind equalizer overflow.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile