The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2004

Filed:

Jan. 27, 2000
Applicant:
Inventors:

Michael I. Miller, Jackson, NH (US);

Navin Khaneja, Portsmouth College, NH (US);

Muge Bakircioglu, Baltimore, MD (US);

Assignee:

Washington University, St. Louis, MO (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/46 ;
U.S. Cl.
CPC ...
G06K 9/46 ;
Abstract

A system according to the invention identifies image data points defining a curve. The method comprises the steps of determining a start point and an end point for the curve, establishing a search space that includes at least the start point, the end point, and other image data elements comprising the curve, and searching the search space using a dynamic programming algorithm to locate image data elements corresponding to the curve. Another embodiment consistent with the present invention identifies image data points defining a curve. The method comprises the steps of determining a start point and an end point for the curve, generating a model of the curve, establishing a search space that includes at least the start point, the end point, and other image data elements comprising the curve, and searching the search space using a dynamic programming algorithm and the model for the curve to locate image data elements corresponding to the curve. Yet another embodiment consistent with the present invention matches a first curve to a second curve. The method comprises the steps of identifying a first curve, identifying a second curve, generating a higher order distance measure for comparing the first curve and the second curve, and matching the first curve to the second curve using the higher order distance measure.


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