The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2004
Filed:
Jul. 15, 1999
Farshid Farrokhnia, Brookfield, WI (US);
Kenneth Scott Kump, Waukesha, WI (US);
Richard Aufrichtig, Moutain View, CA (US);
Alexander Y. Tokman, Waukesha, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
A system for automated x-ray system parameter evaluation is provided. A physical model or template is created and stored in the system, one for each desired phantom. The automated system imports a grayscale x-ray image and then processes the image to determine image components. First, a histogram of the image is created, then a threshold in the histogram is determined and the imported image is binarized with respect to the threshold. Next, connected component analysis is used to determine image components. If the components do not match, then the image is rejected. The system next locates landmarks in the imported image corresponding to expected physical structures. The landmarks include a perimeter ring, vertical and horizontal line segments, and fiducials. The system uses the landmarks to predict Regions of Interest (ROIs) where measurement of the x-ray system parameters takes place. Finally, the x-ray system parameters are measured in the identified ROIs.